References

Semiconductor

Early test verification for a large German semiconductor manufacturer.

Identified problem area:

Late contradictory test results on different test systems from development (EU) and in production (Far-East). Lack of technical and communicative networking.

Solutions developed:

Analysis and SWOT, generation and validation of transferable test content for simulation, development and production tests for early risk assessment and feasibility testing. Cross-departmental and cross-site use and correlation of test results.

Test environment:

Simulation / SW / HW / Communication 

Automotive

Embedded System Test für einen großen deutschen Automobilhersteller.

Identified problem area:

Missing or insufficient test coverage for unit, regression and component tests.

Solutions developed:

Test generation of unit tests for Fail Emulation and System Fault Injection via TESSY to improve the overall SW/HW test coverage.

Test environment:

System / SW

Consumer

Test automation and continuous integration environment for a consumer / industrial handheld tool.

Identified problem area:

Manual measurement and lack of validation of the test environment in case of software changes. Test results not scalable and not reproducible. Lack of networking from development to small series.

Solutions developed:

Fully automated and extensible test environment that verifies impact as part of Continuous Integration and Deployment. Immediate reproducible validation and scalable test environment via SDK based on RaPI.

Test environment:

SW / HW 

Industry

Security tests for combined heat and power units (CHP) and individual rights allocation in the industrial segment.

Identified problem area:

Need for stable recognition of the token HW.

Individualisation of the assignment of rights for PKI/certificates and tokens

Solutions developed:

Automated configuration and installation for industrial PCs (IPC). Application solution at the IPC manufacturer combined with direct delivery to the customer.

Test environment:

System / SW / HW / Communication 

Traffic

Test analysis, concept and validation for sensor products from the railway / automotive segment.

Identified problem area:

Late defect discovery for products shortly before delivery.
Sub-system tests with high cost and time expenditure. Generation change in microcontrollers and test systems.

Solutions developed:

Test concept development for reliable error analysis and early error prevention. Generation of transferable test contents for test systems used. Modernisation of test systems with LXi instruments, among others.

Test environment:

SW / HW / Communication 

Medicine

Fault exclusion for medical technology components in the HiTech Medical Solutions segment.

Identified problem area:

Analysis of multidimensional, rare errors. Ensure product safety across all test domains, exclude errors before delivery.

Solutions developed:

Development of consistently transferable test content for different interfaces using test coordination software and SDK. Tests for fail analysis from prototype to development to production.

Test environment:

SW / HW / Communication 

Research

Participation in the ZIM/BMWI project "Test the Test" (T3) to research and develop new, innovative test technologies.

Identified problem area:

Evaluate the effectiveness of model, software and hardware tests automatically. Fix system defects using fault injection and mutations to improve test quality and coverage across the entire test process.

Solutions to be developed by Viconnis:

HW test specification, HW test case generation and HW test case execution.

Test environment:

System / SW / HW