TestE - Mini test system

Flexible - Cost-effective - Scalable

Scalable - from low-cost to high-performance
Transferable and reusable test content for agile testing

Architecture for analogue and digital tests

Use case

LXI unit control and test case validation

In cooperation with Rigol Technologies EU GmbH, Viconnis has developed an innovative Test concept for the pre-validation of LXI laboratory instruments. Using the TestC test software and the TestE mini test system, selected test sequences can be automated and documented in advance so that the customer/laboratory user can perform their desired test functions by Test automation particularly convenient and reproducible and transferable on the basis of the supplementary test documentation.

Automated Fault Injection for Total Test Coverage

Together with Razorcat GmbH, Viconnis has developed an innovative test concept with TestC APITestE mini test system and TESSY 4.1 for software and hardware test developed.

Automated Fault Injection for Total Test Coverage - Image 1

1st picture:
Without TestC / Fault Injection, 83,33 % Total Coverageas the
Return value of the read_validation_signal() function outside the system
comes and cannot be influenced by TESSY.

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Automated Fault Injection for Total Test Coverage - Image 2

2nd image:
Activate the TestC stimuli via the signal b5 in Test Case 1.1.

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Automated fault injection for total test coverage - Figure 3

3rd image:
Register the Fault Injection, before the branch who has not yet
was covered or on the TestC stimuli executed should be.

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Automated fault injection for total test coverage - Figure 4

4. picture:
Executed with TestC Test and total Coverage 100%.

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Further information on the software TESSY 4.1 from Razorcat GmbH you will receive here.

INTEGRATIVE TEST ARCHITECTURE

Analyze - Test - Learn at an early stage

TestE - Mini test system

Communication via Ethernet, WLAN
Receiver for TestC© test contents
Execution of the test content
result Feedback from TestE to TestC© for comparison - pass / fail
Handover of native LXI raw data to test units (e.g. LXI units)

Cooperative testing with several TestE mini test systems

Master / Multislave
Multiple synchronized analog / digital stimuli and response
Just in time - HW stimuli for SW tests

TestE as test control and test execution

26 Channel GPIO – each driver or expect
Test speed > 1μs / 1MHz , 0v/3,3V digital,
Max 26 analog – out via pwm – 85kSample, max speed 160KS/s- 0.5s
Mini ATE, RPI and HW - Digital Pinelektrionik with driver, Comparator, Active load

Test instruments - additive for TestE

LXI devices e.g.
- Oscilloscopes, protocol analysis, trigger option
- Waveform Generator (AWG)
- Digital Power Supply - Sequence control with trigger option

Extension Boards - additive for TestE

DAC Basisboard - 30k Sampe/s 10bit, 5v, ADC DAC PI *
I2C i2c Expander: Cf. HW Control, SW Control- Transistor - ANALYSE
Transistor / Analog Wave to Speaker
ADC-DAC 12bit, 2x Analog_out 0..2v/0..3.3v 150KS/s SPI 5.4us setup, 1us write
ADC 1xch, 12bit max. Sample 75MS max. Speed 100KS/ch*

*) in preparation

N

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